COMIT 
            LAUNCHES INDUSTRY'S FIRST FULL-SPEED, FAULT ACCUMULATIVE MEMORY BIST 
            SOFTWARE TOOL FOR IMPROVED SOC DEVICE YIELDS 
          Fiesta® 
            CMBT enables real-time testing and generates repair fuse maps for 
            embedded memories
          
         
          Santa Clara, California - April 1, 2003- Comit Systems, a turnkey contract 
          engineering service provider, today introduced its Fiesta® CMBT 
          Memory BIST (built-in self-test) software tool. This newest addition 
          to Comit's proven line of Fiesta solutions is the industry's first memory 
          BIST tool to provide both full-speed and fault-accumulative testing 
          of system-on-chip (SoC) devices with repairable embedded memories. The 
          company estimates that the new tool, shipping now, can improve yields 
          and help achieve up to 50 percent reduction in test and repair costs, 
          while expediting time to market. 
        The 
          burden of testing embedded memory on SoCs and other complex devices 
          falls primarily on the BIST logic, which must precisely identify memory 
          failures, determine whether the memory is repairable, and automatically 
          generate a repair fuse map to indicate failed memory locations. To perform 
          all these functions, the BIST logic must be highly sophisticated, yet 
          efficient enough to keep test costs under control-Comit's Fiesta CMBT 
          is the first embedded memory BIST tool to deliver these capabilities.
        The 
          Fiesta CMBT's ability to lower test costs-a vital issue among chip manufacturers 
          today-is primarily due to the tool's full-speed memory test capability, 
          which helps test embedded memories, including MoSys' 1T-SRAM® embedded 
          memories, at real-time access speeds, ensuring accurate identification 
          of SoC devices that might fail in the field. Commenting on the value-add 
          of the Fiesta CMBT test solution, Comit Systems Vice President of Engineering 
          Venkat Iyer said, "Test cost is a function of time spent under 
          the tester, and accurate identification of repairable devices is critical 
          to improving yield. Our Fiesta CMBT tool simultaneously minimizes test 
          time, and thus test cost, while achieving unmatched detection of repairable 
          devices. We believe this capability will prove instrumental in improving 
          yields on advanced SoC designs for our chipmaking customers and Technology 
          Alliance Program partners, such as MoSys."
          
        TAP 
          partner MoSys (Monolithic System Technology Inc.), the industry's leading 
          provider of high-density SoC embedded memory solutions, provided valuable 
          input during the development of the Fiesta CMBT. Commenting on this 
          cooperative effort, Mark-Eric Jones, MoSys' vice president and general 
          manager of Intellectual Property, stated, "By working closely with 
          Comit and providing our requirements throughout the development stage, 
          we were able to ensure an optimum BIST solution for 1T-SRAM embedded 
          memories. Lower test cost, reducing the test time and simplifying the 
          analysis of test results will immediately benefit our customers."
        As 
          the pioneer of outsourced engineering services, Comit's engineers work 
          directly with customers to achieve rapid design realization, first-silicon 
          successes and significant productivity gains, while simultaneously reducing 
          the possibility of errors. Fiesta CMBT not only addresses two key elements 
          of memory testability-full-speed testing and fault-accumulative testing-it 
          also provides programmable test data patterns and supports all types 
          of read/write latencies. All these critical capabilities are required 
          to ensure that the on-chip embedded memory will not fail in the field, 
          and to more accurately determine whether or not faulty memory is repairable. 
          Full-speed testing examines embedded memory with both the clock speed 
          and access times in real-life values-a significant improvement over 
          currently available at-speed testing, which is limited only to testing 
          at real-life clock speed. The Fiesta CMBT's fault-accumulative testing 
          offers fault-data retention over multiple test passes at varying voltages 
          and temperatures. This is a vast improvement over current traditional 
          offerings, which lose previous data during successive passes.
        The 
          Fiesta CMBT Memory BIST tool is now available for use on Solaris, Linux 
          and Windows operating systems. 
        About 
          Comit Systems
          Founded in 1992 and recognized as one of the 100 fastest-growing private 
          companies in Silicon Valley, Comit Systems, through its Contract Engineering 
          Center in Santa Clara, Calif., provides turnkey contract engineering 
          services for electronic product development through the design of chips, 
          boards, software and systems, using the latest enabling technologies 
          and tools. Comit's comprehensive range of engineering services and highly 
          developed engineering process tools dramatically compresses product 
          development cycles and delivers quality and value to deadline. Similar 
          to what contract manufacturing offered to semiconductor manufacturers 
          in reducing their burden of fixed costs, Comit Systems has developed 
          a unique business model by developing an infrastructure of tools and 
          process templates that reasonably guarantee implementation success. 
          Comit provides scalable resources and a flexible infrastructure comprised 
          of robust, proven processes that help customers achieve reasonable implementation 
          success and improved ROI. More information about Comit Systems, Inc. 
          may be found at www.comit.com
        
          Fiesta(R) is a Comit Systems trademark registered in 
          the U.S. Patent and Trademark Office.
          1T-SRAM(R) is a MoSys trademark registered in the U.S. Patent and Trademark 
          Office.